product

Achieve certain Reliability Evaluations

Our products provide the optimum output to various reliability test. We strongly support the improvement of your product reliability in superior performance, functionality and reliability.

ECM-100 Serise

CAF Tester (Erectrochemical Migration Tester)
ECM-100 Serise

This is a high efficiency tester with the superior ability by the high-speed sampling of 16 milliseconds for ECM(MIG) detection and the high work efficiency by a wide applied voltage range of 1~300V and the high side measurement. It can also be used as a multi-channel insulation resistance meter.

Figure
ECMr-500 Serise

【New Product – Release in 2026】CAF Tester (Erectrochemical Migration Tester)
ECMr-500 Serise

The ECMr-500 Series is a next-generation model that combines the high-speed, multi-channel measurement performance of the ECM-100 Series with the high-voltage capability of the ECM-500 Series, supporting up to 500V. With 16 milliseconds ultra-fast sampling, it enables highly accurate detection of leak-touch phenomena, achieving more advanced reliability evaluation.

Figure
HVUs Serise

High Voltage Insulate Reliability Tester
HVUα Serise

It is possible to detect the high voltage insulation resistance measurement and high-speed events of less than 100n seconds. Instantaneous current change due to partial discharge can also be measured. It is a high- function tester that can separate voltage settings for each channel by applying a voltage circuit of the full independent control.

Figure
RTm-100 Serise

Conduction Reliability Tester
RTm-100 Serise

This is a multi-channel tester to measure the micro-resistance of μΩ level. In high-speed scan processing of 50msec / CH, to measure the exact resistance value by simultaneous sampling of current and voltage. Since it is equipped with an AC/DC current source in the standard are available in a variety of sample evaluation.

Figure
RTm-30DC Serise

Condution Reliability Tester
RTm-30DC Serise

This tester does the conduction reliability evaluation gives the electrical stress on VIA holes and through-hole in the DC current of up to 3A. It can be measured with high accuracy the changes in the micro-resistance of one of VIA by a dedicated design of the measurement circuit. It is ideal for the evaluation of car electronics-related electronic materials and printed circuit board.

Figure