Small resistance measurement of μΩ order
Conduction Reliability Tester RTm-100 Serise

Features

• By high-speed scanning of 50msec/CH can be linked to the high-speed cycle also tested in multi-CH.
• prove the long-term reliability adopted a semiconductor relay for switching 4-terminal network of CH scan.
• A built-in AC / DC current source to the hardware in the standard. It can be selected in software.
• Hardware of the small size and light weight that can be expanded up to 240CH is easy to install and move.
• Possible recording and display of temperature data by connecting the thermocouple.
• Reduce the burden and misses of the soldering work with CH identification easy color cable.
  Measurement cable:2.0m(hardware side) +1.5m(Sample side)

Use

Conduction reliability evaluation of through-hole, solder joints and circuit pattern.