J-RAS contributes to "the reliability of your products"

We contribute to world quality / reliability through development and sale and the trust examination
of the product related to important end-point about a printed wiring board or electronic materials.

about Electrochemical Migration

In late years evaluation about safety and the reliability of products attracts attention by the recalls of products.
As for the reliability of the product, it is confirmed evaluation by a quality control system of research and development or a manufacturing process of material.And the method follows a change of the demand of the market and evolves every day. The new electronic material and development of products that considered a global environment in particular are prosperous(for example Lead-free solder alloym,RoHS), and it is the situation that must review an evaluation method of the reliability with it today.

Erectrochemical Migration Tester

products

Update Information

  • 2025/10/31 [Notice]

    We will exhibit at NEPCON Japan 2026 (40th Electrotest Japan).

    Our highly acclaimed testers will be on display, including:
    *The newly upgraded Electrochemical Migration Tester ECMr-100 Series
    *The High-Voltage Insulation Reliability Evaluation System HVUα Series

    Please be sure to visit our booth!

    Date: January 21 (Wed) – January 23 (Fri), 2026
    Venue: Tokyo Big Sight, East Exhibition Hall
    Booth: E21-22

contact us

We will develop products related to insulation reliability (ion migration), etc., which are important evaluation items for printed circuit boards and electronic materials, and will contribute to the quality and reliability of your company through sales of them.
Please feel free to contact us if you have any questions or requests about ion migration inspection of printed circuit boards or insulation resistance measuring instruments ECM - 100 etc.
We are waiting for inquiries about our products and services.

Please Click here to contact us.